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  • 匿名
关注:1 2013-05-23 12:21

求翻译:Highly oriented pyrolytic graphite substrates with fresh cleaved surfaces were first etched by O2-plasma at 90 C with plasma power of 120 W for around 30 s to introduce dense dot defects in the topmost layer. In order to view these defects directly, we enlarged them into small pits with size of 10–20 nm with hydroge是什么意思?

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Highly oriented pyrolytic graphite substrates with fresh cleaved surfaces were first etched by O2-plasma at 90 C with plasma power of 120 W for around 30 s to introduce dense dot defects in the topmost layer. In order to view these defects directly, we enlarged them into small pits with size of 10–20 nm with hydroge
问题补充:

  • 匿名
2013-05-23 12:21:38
高定向热解石墨基材的新鲜切割面都在? 90 ? C时, 120瓦左右30秒等离子电源引入的最上面一层致密的点缺陷的第一蚀刻O2等离子体。
  • 匿名
2013-05-23 12:23:18
正在翻译,请等待...
  • 匿名
2013-05-23 12:24:58
高度针对的高温分解的石墨基体与新被劈开的表面由O2血浆在最上面的层数首先铭刻在 90  C以血浆力量的120 W为大约30 s介绍密集的小点瑕疵。 而蚀刻仅发生在边缘在瑕疵附近,为了直接地观看这些瑕疵,我们扩大他们 (入) 小坑以大小的10-20毫微米与氢H2血浆在 525  C以血浆力量的100 W在10分钟。
  • 匿名
2013-05-23 12:26:38
具有新鲜切割表面的高定向热解石墨基底第一次刻 O2 等离子体在 90 ℃ 用等离子电源 120 W 的大约 30 s 引入密集点缺陷在顶部图层。若要查看这些缺陷直接,我们出来放大成小坑,大小为 10 – 20 毫微米与氢气 (H2) 血浆 525 ℃ 用等离子电源的 100 W 为 10 分钟,虽然只在围绕缺陷边缘刻蚀时发生。
  • 匿名
2013-05-23 12:28:18
Highly oriented pyrolytic graphite substrates with fresh cleaved surfaces were first etched by O2-plasma at 90 C with plasma power of 120 W for around 30 s to introduce dense dot defects in the topmost layer.In order to view these defects directly, we enlarged them into small pits with size of 10
 
 
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