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关注:1
2013-05-23 12:21
求翻译:Plasma-oxidation was conducted under atmospheric-pressure and the temperature of the substrate during oxidation was measured to be less than 100 °C which was extremely low compared with that of thermal-oxidation. It was considered that high substrate temperature was the main reason why many pits were generated in therm是什么意思? 待解决
悬赏分:1
- 离问题结束还有
Plasma-oxidation was conducted under atmospheric-pressure and the temperature of the substrate during oxidation was measured to be less than 100 °C which was extremely low compared with that of thermal-oxidation. It was considered that high substrate temperature was the main reason why many pits were generated in therm
问题补充: |
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2013-05-23 12:21:38
等离子体氧化物在大气压力和衬底的氧化过程中的温度下进行,结果为小于100 ℃,这是非常低的与热氧化比较。
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2013-05-23 12:23:18
等离子氧化作用被举办了在大气压力下,并且基体的温度在氧化作用时少于100极低比较那热量氧化作用的°C被测量是。被考虑高基体温度是主要原因许多坑为什么在热量氧化作用引起了,当仅少量在等离子氧化作用时引起了。
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2013-05-23 12:24:58
血浆氧化作用被举办了在大气压力下,并且基体的温度在氧化作用期间被测量是少于100是极端低的比较那热量氧化作用的°C。 它被考虑高基体温度是主要原因为什么许多坑在热量氧化作用引起了,当仅少数在血浆氧化作用时引起了。
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2013-05-23 12:26:38
在大气压力下进行了等离子体氧化和氧化过程中基体温度测量要小于 100 ° C 的极低相比,热氧化。认为高衬底温度是虽然只有少数中等离子体氧化生成了许多坑为什么热氧化过程中产生的主要原因。
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2013-05-23 12:28:18
血浆氧化在大气压力下被进行和在氧化期间的 substrate 的温度被测量是少于 100 非常低被与热氧化比较的° C。高 substrate 温度是很多坑在热氧化方面被生成的主要理由被考虑当仅没几个在血浆氧化方面被生成。
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