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关注:1
2013-05-23 12:21
求翻译:光學顯微鏡 (OM)來判定石墨烯基板和石墨烯的反射光強度的不同所造成的對比度差異來分辨層數,也可以由矽基板上不同厚度的氧化層。是什么意思?![]() ![]() 光學顯微鏡 (OM)來判定石墨烯基板和石墨烯的反射光強度的不同所造成的對比度差異來分辨層數,也可以由矽基板上不同厚度的氧化層。
问题补充: |
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2013-05-23 12:21:38
正在翻译,请等待...
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2013-05-23 12:23:18
Optical Microscope (OM) to determine graphite alkene panels and graphite alkene reflex optical strength of different caused a contrast differences to tell the difference between floors, also by silicon base plate thickness of the different carbon-level.
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2013-05-23 12:24:58
Light microscope (OM) determines the contrast gradient difference which the graphite alkene foundation plate and the graphite alkene reflection light intensity different creates to distinguish the layer, also may by xi the foundation plate on the different thickness oxide layer.
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2013-05-23 12:26:38
Optical microscope (OM) to determine Graphene substrate and Graphene's reflected light intensity caused by contrast differences to distinguish between layers, or by varying the thickness of the oxide layer on Si substrate.
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2013-05-23 12:28:18
正在翻译,请等待...
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