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关注:1
2013-05-23 12:21
求翻译:在我司電測機上對不良品進行電測,發現有缺畫現象(如圖1),在显微镜下进行缺畫观察,发现SEG 3被刮斷(如图2),不良原因分析為,ITO刮傷是由於前製程,在進行完顯影工序後,生產人員會對產品進行抽檢,在抽檢過程中,由於不小心與顯微鏡鏡頭發生碰擦,導致PR膠被刮掉一部分,在後續工序蝕刻時ITO導電沒有PR膠保護,導致ITO被蝕刻,最終產生缺畫不良。是什么意思?![]() ![]() 在我司電測機上對不良品進行電測,發現有缺畫現象(如圖1),在显微镜下进行缺畫观察,发现SEG 3被刮斷(如图2),不良原因分析為,ITO刮傷是由於前製程,在進行完顯影工序後,生產人員會對產品進行抽檢,在抽檢過程中,由於不小心與顯微鏡鏡頭發生碰擦,導致PR膠被刮掉一部分,在後續工序蝕刻時ITO導電沒有PR膠保護,導致ITO被蝕刻,最終產生缺畫不良。
问题补充: |
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2013-05-23 12:21:38
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2013-05-23 12:23:18
In respect the detected on the poor quality for the detected, find that there are no plans for (Figure 1), the display micro mirror the are no-intuitive observation to a live SEG 3 is the up (such as image 2), poor reason analysis, ITO scratches is due to the process in the developer those, producti
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2013-05-23 12:24:58
Takes charge of in the electrical measurement machine in me to not good to carry on the electrical measurement, discovered has lacks the picture phenomenon (e.g. Figure 1), carries on under the microscope lacks the picture observation, discovered SEG 3 blow breaks (e.g. Figure 2), not the good reaso
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2013-05-23 12:26:38
In our electric measuring machine Shang on bad products for Electric measuring, found has deficiency painting phenomenon (as Figure 1), in microscope Xia for deficiency painting observation, found SEG 3 was scraping broken (as Figure 2), bad reasons analysis for, ITO scraping injury is due to Qian b
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2013-05-23 12:28:18
正在翻译,请等待...
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