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关注：1
2013-05-23 12:21
求翻译：询问了一下UAT，表示可以LDS扫描完了以后用AOI来寻找缺陷，但是如果false defect过多或者微小的缺陷还是必须要PDS才能找到，用户可以自己选择是什么意思？ 待解决
 悬赏分：1
- 离问题结束还有
询问了一下UAT，表示可以LDS扫描完了以后用AOI来寻找缺陷，但是如果false defect过多或者微小的缺陷还是必须要PDS才能找到，用户可以自己选择
问题补充： |
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2013-05-23 12:21:38
Asked about the UAT, that can scan over the future use of AOI LDS to find flaws, but if too many false defect or minor defects or PDS must be found, the user can choose
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2013-05-23 12:23:18
Asked about the UAT LDS scan after it was over, and said that it could be used to find flaws AOI false defect, but if excessive or minor deficiencies must be PDS or can be found, the user can choose
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2013-05-23 12:24:58
Inquired UAT, indicated might LDS scan later has sought the flaw with AOI, but if false defect excessively were many or the small flaw must want PDS to be able to find, the user might own choose
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2013-05-23 12:26:38
Asked about the UAT, LDS after finished scanning with AOI to look for defects, but if too many false defect or small defects or do we have to PDS can be found, the user can choose
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2013-05-23 12:28:18
Asked about the UAT, LDS after finished scanning with AOI to look for defects, but if too many false defect or small defects or do we have to PDS can be found, the user can choose
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